| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit designed in a shift scanning mode and allowing reduction in the amount of test data, the number of scan data input/output terminals, or a test time. SOLUTION: A semiconductor integrated circuit 101 is designed in a shift scanning mode. In this case, two partial circuits 171, 172 constructed of a plurality of FF with a scanning function 111-113, 131-133 working as shift registers and a scan chain 110 connecting the respective FF with a scanning function to each other are provided, and the partial circuits 171, 172 are connected together in a single branch point 153. |
