| 摘要 |
PROBLEM TO BE SOLVED: To obtain a spectrum analyzer easily imaging all wave lengths at a two-dimensional detector at a low price to measure every wavelength. SOLUTION: In a spectrum analyzer comprising a diffraction grating 7 diffracting incident light and an order dispersing element 4 further dispersing the diffracted light by the grating 7 every diffraction order, the grating 7 is placed in a diffraction face 14 and rotatably with a straight line 16 vertical to an inscribing line of the channel of the grating 7 as an axis.
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