DEVICE AND METHOD FOR AUTOMATICALLY PRODUCING TEST PATTERN

摘要

PROBLEM TO BE SOLVED: To provide a device and method for automatically producing test pattern by which a corrected part can be activated by detecting the difference between an uncorrected circuit and a corrected circuit. SOLUTION: A corrected part information extracting means 106 extracts information on a corrected part based on new circuit information 102 and old circuit information 101. A corrected-part information activating pattern producing means 108 produces a corrected part activating pattern 109 which activates a corrected part based on corrected part information 107 and new circuit information 102. A 1chipATPG executing means 110 produces a 1chipATPG test pattern 111 by using the conventional ATPG(automatic test pattern generating method) algorithm based on the new circuit information 102. A corrected part activating pattern merging means 112 produces a test pattern 114 by merging the 1chipATPG test pattern 111 with the corrected part activating pattern 109. Since the test pattern 114 activates the corrected part, the pattern 114 can distinguish an uncorrected circuit and a corrected circuit from each other.