发明名称 Interface independent test system
摘要 A system and method for circuitry design verification testing using a structure of interface independent classes to provide for rapid prototyping and design modification while maximizing test code re-use. A circuit simulation subsystem is interfaced with a test subsystem. The test subsystem employs a system transaction class for collecting common routines and pointers to device transactions. One or more configuration transaction classes derived from the system transaction class define transactions between functional models within the simulation subsystem and cause instantiation of the respective functional models. Operations are performed on the functional models via pointers to interface independent transaction classes which define interfaces to the devices. The operations are mapped to the current designs of the functional models by subclasses of the interface independent transaction classes. Changes to the functional model designs necessitate changes to the subclasses, but the interface independent transaction classes maintain a consistent interface and allow the test code to be re-used with minimal changes.
申请公布号 AU3716500(A) 申请公布日期 2000.09.21
申请号 AU20000037165 申请日期 2000.03.03
申请人 SUN MICROSYSTEMS, INC. 发明人 GLENN A. DEARTH;GEORGE R. PLOUFFE JR.;DAVID M. KAFFINE;JANET Y. ZHENG
分类号 G01R31/00;G01R31/27;G01R31/28;G06F9/455;G06F17/50;H01L21/66 主分类号 G01R31/00
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