发明名称 |
Force sensing probe for scanning probe microscopy |
摘要 |
Force sensing probes for use in scanning probe microscopes and a method for coating such probes with a film comprising a magnetostrictive material are provided. The probes may be magnetized by placing them in a magnetic field which can be oriented in any direction with respect to the probes. The magnetostrictive effect leads to a compression or expansion of the magnetic film, altering its length by the strength of the applied field. This in turn causes the probe, which in a preferred embodiment is in the form of a cantilever, and the applied magnetic film, to deflect or bend. The consequent motion of the probe is much greater than that obtained by direct application of a magnetic force and the effect is not sensitive to the direction of the applied field.
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申请公布号 |
US6121611(A) |
申请公布日期 |
2000.09.19 |
申请号 |
US19980082095 |
申请日期 |
1998.05.20 |
申请人 |
MOLECULAR IMAGING CORPORATION;ARIZONA BOARD OF REGENTS |
发明人 |
LINDSAY, STUART M.;JING, TIANWEI |
分类号 |
G01B7/34;G01B5/28;G01B7/00;G01N27/00;G01Q60/40;G01Q70/14;(IPC1-7):G01B5/28 |
主分类号 |
G01B7/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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