发明名称 METHOD FOR PREVENTING DISLOCATION OF SEMICONDUCTOR DEVICE INCLUDING TRENCH ISOLATION
摘要 PURPOSE: A method for preventing a dislocation of a semiconductor device including a trench isolation is provided to prevent a dislocation in an edge portion of the trench isolation by reducing a stress given to the trench isolation, in which the stress is caused by an expanded volume of a silicon. CONSTITUTION: A method for preventing a dislocation of a semiconductor device including a trench isolation comprises the step of forming a plurality of sacrificial oxide layers on a semiconductor substrate having the trench isolation, in which at least one of a plurality of the sacrificial oxide layers is formed by a deposition process.
申请公布号 KR20000056159(A) 申请公布日期 2000.09.15
申请号 KR19990005233 申请日期 1999.02.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YUN SEONG
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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