发明名称 |
METHOD FOR PREVENTING DISLOCATION OF SEMICONDUCTOR DEVICE INCLUDING TRENCH ISOLATION |
摘要 |
PURPOSE: A method for preventing a dislocation of a semiconductor device including a trench isolation is provided to prevent a dislocation in an edge portion of the trench isolation by reducing a stress given to the trench isolation, in which the stress is caused by an expanded volume of a silicon. CONSTITUTION: A method for preventing a dislocation of a semiconductor device including a trench isolation comprises the step of forming a plurality of sacrificial oxide layers on a semiconductor substrate having the trench isolation, in which at least one of a plurality of the sacrificial oxide layers is formed by a deposition process.
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申请公布号 |
KR20000056159(A) |
申请公布日期 |
2000.09.15 |
申请号 |
KR19990005233 |
申请日期 |
1999.02.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YUN SEONG |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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