发明名称 Semiconductor device and method with improved flat surface
摘要 A semiconductor substrate has an element formation region and a scribe line region surrounding the element formation region. A metal wiring layer is formed so as to cover end portions of a plurality of interlayer insulating films over the entire periphery of the element formation region and includes cut portions at the corner of the element formation region. Then, a SOG film is formed on the entire surface of the substrate by spin coating, at that time, material of the SOG film flows out through the cut portion toward the scribe line region to prevent a SOG puddle from forming at the corner of the element formation region. <IMAGE>
申请公布号 EP0899788(A3) 申请公布日期 2000.09.13
申请号 EP19980116236 申请日期 1998.08.27
申请人 NEC CORPORATION 发明人 YAMADA, NAOTO;YOSHIDA, NAOYUKI;KIMURA, ATSUSHI
分类号 H01L21/768;H01L23/528;H01L23/58 主分类号 H01L21/768
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