发明名称 WAFER POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a polishing device which can keep the relative speed between a polishing head and a wafer constant, give a constant pressure and uniformly polish the surface of the wafer. SOLUTION: This device is constituted in such a way that the peripheral surface of the bottom of a drum 2 and the top face of a wafer placing table 6 opposing to the peripheral surface move in the same direction, and the peripheral surface of the tip section of the drum 2 and the top face of a wafer placing table 6 opposing to the peripheral surface move in the opposite direction, and the relative speed of the rotation of a wafer W caused by the wafer placing table 6 to the speed of the rotation of a polishing pad 21 caused by the rotation of the drum 2 becomes nearly constant in the wafer W to be polished.
申请公布号 JP2000246626(A) 申请公布日期 2000.09.12
申请号 JP19990056574 申请日期 1999.03.04
申请人 TOSHIBA CERAMICS CO LTD 发明人 EBINA MAKOTO;IWAI SEIJI;TSUJIMOTO KENICHI
分类号 B24B37/07;H01L21/304 主分类号 B24B37/07
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