发明名称 Image plate diffractometer for registering x-ray diffraction diagrams of crystalline material has image plate for exposing x-ray beam diffracted by material that is arranged at distance from material in curvilinear manner
摘要 An x-ray light source (1) forms one a x-ray beam which is led on a material (3). An image plate (2,2) is used for exposing the x-ray beam diffracted by the material (3). The marked image plate (2,2) is arranged at a distance from the material (3) in a curvilinear manner.
申请公布号 DE19904476(A1) 申请公布日期 2000.09.07
申请号 DE19991004476 申请日期 1999.02.04
申请人 J. SCHNEIDER ELEKTROTECHNIK GMBH 发明人 KREUTZ, W.
分类号 G01N23/20;(IPC1-7):G01N23/20;G11B9/10 主分类号 G01N23/20
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