发明名称 |
Image plate diffractometer for registering x-ray diffraction diagrams of crystalline material has image plate for exposing x-ray beam diffracted by material that is arranged at distance from material in curvilinear manner |
摘要 |
An x-ray light source (1) forms one a x-ray beam which is led on a material (3). An image plate (2,2) is used for exposing the x-ray beam diffracted by the material (3). The marked image plate (2,2) is arranged at a distance from the material (3) in a curvilinear manner.
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申请公布号 |
DE19904476(A1) |
申请公布日期 |
2000.09.07 |
申请号 |
DE19991004476 |
申请日期 |
1999.02.04 |
申请人 |
J. SCHNEIDER ELEKTROTECHNIK GMBH |
发明人 |
KREUTZ, W. |
分类号 |
G01N23/20;(IPC1-7):G01N23/20;G11B9/10 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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