发明名称 Method of fabricating dynamic random access memory
摘要 A method of fabricating a DRAM. A substrate comprising a MOS is provided. A first dielectric layer is formed on the substrate. The first dielectric layer is patterned to form a bit line contact window exposing a source region of the MOS and a node contact window exposing a drain region of the drain region simultaneously. The bit line window and the node contact window are filled with a bit line and a polysilicon plug by the formation of the same polysilicon layer, respectively. A second dielectric layer with an opening exposing the polysilicon plug is formed on the first dielectric layer. The sidewall and bottom surface of the opening are covered by another polysilicon layer. The second dielectric layer is removed to leave a node contact in contact with the polysilicon plug.
申请公布号 US6114202(A) 申请公布日期 2000.09.05
申请号 US19990329110 申请日期 1999.06.09
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORP. 发明人 TSENG, HORNG-HUEI
分类号 H01L21/02;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/02
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