| 摘要 |
Disclosed is a method and apparatus for increasing the speed of electromagnetic emission scanning of an electronic device under test. Included is an array of electromagnetic emission detection probes, decoder and driver circuits to address a selected number of probes in the probe array in a predetermined manner, a micro-controller to instruct and supervise the decoder and driver circuits, an analogue to digital converter, a memory circuit, a system controller and a display. The device under test is energized and located adjacent to the array of probes. The micro-controller instructs the decoder and driver circuits to address, individually and successively a specific group or list of probes during a first scanning period. The emission level from each of the addressed probes is measured, digitized and stored in memory circuits as a first data set. The system controller integrates, scales, maps and displays the first data set on the display for interpretation by an operator concomitant with the next data set being collected by the micro-controller. Collected data sets are passed to the system controller for processing and the sampling steps are repeated until the operator receives the desired level of electromagnetic characterization and terminates the scan.
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