发明名称 APPARATUS FOR MEASURING JITTER
摘要 PROBLEM TO BE SOLVED: To make measurable a jitter with high accuracy and over a wide range. SOLUTION: In an operating-range judgment circuit 23, an error signal Er which is outputted from a first low-pass filter 14 is judged to be outside an operating range when it exceeds a first voltage range±V1 corresponding to the linear operating range of a phase-frequency comparator 13. In addition, in a second low-pass filter 22, a DC component which is contained in the error signal is amplified to a voltage which is larger than a signal component in the frequency band of a jitter to be measured. In a synchronization judgment circuit 24, the output signal of the second low-pass filter 22 is judged to be outside a synchronization when it exceeds a second voltage range±V4 which is set to be wider than the linear operating range of the phase-frequency comparator 13.
申请公布号 JP2000230952(A) 申请公布日期 2000.08.22
申请号 JP19990031762 申请日期 1999.02.09
申请人 ANRITSU CORP 发明人 ISHIBE KAZUHIKO
分类号 G01R29/02;H04L25/02;(IPC1-7):G01R29/02 主分类号 G01R29/02
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