发明名称 Method of creating low resistance contacts in high aspect ratio openings by resputtering
摘要 A method of producing a low resistance contact in an opening carried in a substrate is comprised of the steps of forming a first layer of conductive material along a portion of the walls of the opening. A portion of the conductive material is resputtered from the walls of the opening to form a thin layer at the bottom of the opening. A second layer of conductive material is deposited on the substrate in a manner to fill the opening. A contact thus formed is also disclosed.
申请公布号 US6106677(A) 申请公布日期 2000.08.22
申请号 US19980056211 申请日期 1998.04.07
申请人 MICRON TECHNOLOGY, INC. 发明人 SANDHU, GURTEJ S.
分类号 C23C14/04;C23C16/04;H01L21/768;(IPC1-7):C23C14/34 主分类号 C23C14/04
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