发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the energy loss of a conductive wiring and to contrive to raise the characteristics of an on-chip inductor in a semiconductor device. SOLUTION: A p-type silicon substrate 1 is prepared as a support substrate and a heat treatment is performed on the substrate 1, whereby heat donors are generated in the substrate 1, acceptors in the substrate 1 are compensated by the donors and a carrier concentration in the substrate 1 is reduced to a low concentration. When the donors are generated in the substrate 1 by performing the heat treatment on the substrate 1 in such a way, the donors compensate with the acceptors in the substrate 1 to each other. Therefore, the carrier concentration in the substrate 1 is apparently changed into the low concentration and the substrate 1 can be increased in resistance. As a result, the energy loss of a conductive wiring can be reduced and the enhancement of the characteristics of an on-chip inductor can be contrived in a semiconductor device.
申请公布号 JP2000232212(A) 申请公布日期 2000.08.22
申请号 JP19990196348 申请日期 1999.07.09
申请人 DENSO CORP 发明人 URAGAMI YASUSHI;ONODA KUNIHIRO;OSHIMA HISAZUMI;TOKUDA YUTAKA;YAMAUCHI SHOICHI
分类号 H01L21/18;H01L21/02;H01L21/265;H01L21/322;H01L21/324;H01L21/336;H01L27/12;H01L29/786;(IPC1-7):H01L27/12 主分类号 H01L21/18
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