发明名称 FLATNESS MEASURING METHOD AND MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce work in measurement of flatness and improve measurement accuracy. SOLUTION: A guide rail 3 is fixed on a metal surface 1 of a measuring object by a support member 2 consisting of magnet supporting both ends of the guide rail 3. Flatness of metal surface 1 is measured with a laser type displacement meter 5 provided movably along the guide rail 3. With this method, flatness measurement becomes possible with ease and high accuracy even in the case the measuring object surface is facing downward.
申请公布号 JP2000227320(A) 申请公布日期 2000.08.15
申请号 JP19990026720 申请日期 1999.02.03
申请人 TOSHIBA CORP 发明人 HARADA SHIGERU;TAKEDA KAZUHIRO
分类号 G01B11/30;G01B21/30;(IPC1-7):G01B11/30 主分类号 G01B11/30
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