发明名称 POLISHING HEAD, POLISHING DEVICE, AND POLISHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a polishing head, a CMP(chemical mechanical polishing) polishing device, and a polishing method, where not only ensures the peripheral part of a wafer of polishing uniformity, and an edge cut (EE: edge exclusion) can be made as small as possible. SOLUTION: A work 4 (polished member) held on a polishing head 1 is pressed down against on the surface of a polishing body 3, the work 4 and the polishing body 3 are moved relative with respect to each other interposing abrasive material between them, with which the work 4 is polished by the polishing, head 1. The polishing head 1 is equipped with an elastic film 13 with which the work 4 is held, a ring 23 to which the periphery of the elastic film 13 is fastened, a flexible holding member 8 to which the ring 23 is fixed, a hermetic space 9 formed inside the polishing head 1 making the elastic film 13 serve as a part of a boundary, and a hermetic member 14 provided to the ring 12 so as to form a hermetic space 9.
申请公布号 JP2000223447(A) 申请公布日期 2000.08.11
申请号 JP19990023671 申请日期 1999.02.01
申请人 NIKON CORP 发明人 MATSUKAWA EIJI;ISHIKAWA AKIRA;CHIGA TATSUYA;MIYAJI AKIRA
分类号 B24B37/005;B24B37/04;B24B37/30;H01L21/304 主分类号 B24B37/005
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