发明名称 A bistable SCR-like switch for ESD protection of silicon-on-insulator integrated circuits
摘要 A bistable SCR-like switch (41) protects a signal line (65) of an SOI integrated circuit (40) against damage from ESD events. The bistable SCR-like switch (41) is provided by a first and a second transistors (42 and 44) which are formed upon the insulator layer (46) of the SOI circuit (40) and are separated from one another by an insulating region (60). Interconnections (62 and 64) extend between the two transistors (42 and 44) to connect a P region (62) of a first transistor (42) to a P region (54) of the second transistor (44) and an N region (50) of the first transistor (42) to an N region (58) of the second transistor (44). The transistors (42 and 44) may be either bipolar transistors or enhancement type MOSFET transistors. For bipolar transistors, the base of an NPN transistor (42) is connected to the collector of a PNP transistor (44) and the base of the PNP transistor (44) is connected to the collector of the NPN transistor (42). MOSFET transistors are similarity connected, with the intermediate portion of the P-well (43) forming channel region of the N-channel transistor (42) connected to the drain of the P-channel transistor (44), and the N-well (45) forming the channel region of the P-channel transistor (44) connected to the drain of the N-channel transistor (42). Resistors (72 and 74) can be connected between the two transistors (42 and 44) to determine the trigger and holding voltages for the bistable SCR-like switch (41). <IMAGE>
申请公布号 EP0852400(A3) 申请公布日期 2000.08.09
申请号 EP19980300009 申请日期 1998.01.02
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHATTERJEE, AMITAVA;AMERASEKERA, EKANAYAKE AJITH
分类号 H01L27/04;H01L21/822;H01L21/8228;H01L21/84;H01L27/02;H01L27/06;H01L27/082;H01L27/092;H01L27/12;H01L29/786 主分类号 H01L27/04
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