| 摘要 |
A socket assembly includes a socket base having a recess for receiving the device under test; a lid; latches for releasably closing the lid over the socket base; a backup member positioned within the lid so as to be moveable relative thereto; a lock down member located in the lid and contacting the backup member such that when the lid is connected to the socket base, the lock down member is operable to urge the backup against the device under test; a heat exchange device located in the backup member so as to contact an integrated circuit in the device under test when the backup is urged against the device under test; and control lines passing from the heat exchange device through the lock down member, the control lines being connectable to a heat exchange control system located externally to the apparatus. <IMAGE> |
