发明名称 Automatic ranging apparatus and method for precise integrated circuit current measurements
摘要 A computer-based test method and apparatus for measuring DC current drawn by an integrated circuit. The apparatus has a plurality of current measurement ranges and is first initialized to a selected one of the measurement ranges. Next, the apparatus measures the DC current drawn by the integrated circuit in the selected measurement range and increments the selected measurement range if the measured DC current is out of the selected measurement range. The apparatus repeats the steps of measuring and incrementing until the measured DC current is in the selected measurement range. The measured DC current is then compared to a specification limit for the integrated circuit.
申请公布号 US6101458(A) 申请公布日期 2000.08.08
申请号 US19970961163 申请日期 1997.10.30
申请人 LSI LOGIC 发明人 SUGASAWARA, EMERY;IRRINKI, V. SWAMY;GOURAVARAM, SUDHAKAR R.
分类号 G01R31/30;(IPC1-7):G01R27/00 主分类号 G01R31/30
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