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发明名称
Messeinrichtung zur Bestimmung der temperaturabhaengigen Durchschlagsspannung bei Halbleitergleichrichtern und Transistoren
摘要
申请公布号
DE1080694(B)
申请公布日期
1960.04.28
申请号
DE1958L030768
申请日期
1958.07.10
申请人
LICENTIA PATENT-VERWALTUNGS-G.M.B.H.
发明人
SEIDLER DIPL.-ING. GERHARD
分类号
G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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