发明名称 |
ELECTROOPTICAL SAMPLING PROBER |
摘要 |
PROBLEM TO BE SOLVED: To provide a positioning mechanism of an electrooptical crystal that is simple and does not require any experience in electrooptical sampling measurement. SOLUTION: The electrooptical sampling prober for observing the waveform of a signal to be measured according to the polarization state of an incident light pulse by connecting an electric field being generated by a signal to be measured to the electrooptical crystal and applying the light pulse being generated based on a timing signal to the electrooptical crystal is provided with an electrooptical crystal 1 with a collar-shaped stopper at an upper part, an electrooptical crystal retention part 2 that retains the electrooptical crystal 1 with the above stopper so that it does not fall and at the same time the electrooptical crystal 1 can be moved up and down, and an electrooptical crystal drive part 3 for linearly driving the electrooptical retention part 2 in the direction of the light axis of the above light pulse while the electrooptical crystal retention part 2 is mounted.
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申请公布号 |
JP2000214230(A) |
申请公布日期 |
2000.08.04 |
申请号 |
JP19990012492 |
申请日期 |
1999.01.20 |
申请人 |
ANDO ELECTRIC CO LTD;NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
TORIYAMA NORIYUKI;NAGATSUMA TADAO;SHINAGAWA MITSURU;YAMADA JUNZO |
分类号 |
G01R31/302;G01R1/07;(IPC1-7):G01R31/302;G01R1/06;G01R19/00;G01R29/12;H01L21/66 |
主分类号 |
G01R31/302 |
代理机构 |
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代理人 |
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地址 |
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