发明名称 EQUIPMENT FOR PRODUCTION OF BOTH-SIDE PHOTOMASK
摘要 <p>PROBLEM TO BE SOLVED: To simultaneously manufacture patterns on both sides of a photomask by installing two sets of pattern forming devices for each on both sides of a masking plate. SOLUTION: A both-side photomask production system consists of a first particle source, a second particle source, a first focusing assembly 200a, a second focusing assembly 200b and a mechanical stage. The mechanical stage is used to mount a masking plate 240 and to move a substrate 242 to a prescribed position. The first and second particle sources are the electron beams generated by an electron gun. The first focusing assembly 200a and the second focusing assembly 200b act simultaneously to respectively converge the two electronic beams onto photoresist layers 248a and 248b. Then, the patterns on the photoresist layers 248a and 248b are transferred to antireflection layers 246a and 246b and masking layers 244a and 244b, by which the both-side photomask are formed.</p>
申请公布号 JP2000214573(A) 申请公布日期 2000.08.04
申请号 JP19990009379 申请日期 1999.01.18
申请人 UNITED MICROELECTRONICS CORP 发明人 RIN SHIMIN
分类号 H01L21/302;G03F1/76;G03F1/78;H01L21/027;(IPC1-7):G03F1/08 主分类号 H01L21/302
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