发明名称 FAILURE DETECTION CIRCUIT OF HIGH PRESSURE GENERATING DEVICE
摘要 PURPOSE: A circuit for detecting an abnormal condition of a high pressure generating apparatus is provided to prevent an accident and a wrong operation by stopping an operation of a high pressure generating apparatus when there is generated an abnormal condition. CONSTITUTION: An integrated circuit part generates a predetermined frequency. A field effect transistor repeats on/off by the frequency generated in the integrated circuit part and intermitts a current flowing a primary coil. A detecting coil detects a current flowing a secondary coil of a high pressure transducer. A voltage is organized to the secondary side of the high pressure transducer according to the current flowing the primary coil of the high pressure transducer. A current detecting part(100) detects the current flowing the primary coil of the high transducer and makes the output signal of the integrated circuit into low or high. When a voltage is instantly raised, the detecting coil of the high transducer disables the integrated circuit. When the instant voltage rise is released and a normal condition is returned, an overload detecting part enables the integrated circuit.
申请公布号 KR100262729(B1) 申请公布日期 2000.08.01
申请号 KR19970032107 申请日期 1997.07.10
申请人 LG ELECTRONICS INC. 发明人 PARK, YONG GO
分类号 H02H7/12;(IPC1-7):H02H7/12 主分类号 H02H7/12
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