发明名称 PROTECTOR FOR SUBSTRATE SUPPORTING SURFACE AND PRODUCTION THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To prevent contaminating substances from reacting on the surface of a support while decreasing the bonding coefficient plasma etching the supporter surface of a ceramic chuck for supporting a semiconductor wafer, depositing a layer of protective coating material on the top and arranging a spacing mask. SOLUTION: A ceramic electrostatic chuck 104 has a protection coating 100 arranged on top of a plasma etched support surface 102 and a spacing mask 110 arranged on top thereof. The protection coating 100 is composed of a material having properties different from those of the support surface and thereby it does not react on the contaminating substances in the atmosphere. Formation of a conductive film on the ceramic chuck is thereby blocked. Consequently, the support surface 102 of the chuck 104 is blocked from the machining chamber environment without fail and the support surface of the chuck 104 does not touch the rear surface 114 of the wafer 112. The protection coating does not thereby disturb the tightening process significantly.</p>
申请公布号 JP2000208595(A) 申请公布日期 2000.07.28
申请号 JP19990322251 申请日期 1999.11.12
申请人 APPLIED MATERIALS INC 发明人 TSUEN SHUU;PARKHE VIJAY;TZOU EUGENE
分类号 B23Q3/15;C23C16/30;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 主分类号 B23Q3/15
代理机构 代理人
主权项
地址