发明名称 |
Halbleiterbauelement und Verfahren zu dessen Herstellung |
摘要 |
The invention relates to a semiconductor element with at least one layer of tungsten oxide (WOx), optionally in a structured tungsten oxide (WOx) layer. The inventive semiconductor element is characterized in that the relative permittivity ( epsilon r) of the tungsten oxide layer (WOx) is higher than 50.
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申请公布号 |
DE19901210(A1) |
申请公布日期 |
2000.07.27 |
申请号 |
DE19991001210 |
申请日期 |
1999.01.14 |
申请人 |
SIEMENS AG |
发明人 |
SCHREMS, MARTIN;DRESCHER, DIRK;WURZER, HELMUT;TEWS, HELMUT |
分类号 |
H01L29/78;H01L21/28;H01L21/316;H01L21/8242;H01L27/108;H01L29/51;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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