发明名称 Halbleiterbauelement und Verfahren zu dessen Herstellung
摘要 The invention relates to a semiconductor element with at least one layer of tungsten oxide (WOx), optionally in a structured tungsten oxide (WOx) layer. The inventive semiconductor element is characterized in that the relative permittivity ( epsilon r) of the tungsten oxide layer (WOx) is higher than 50.
申请公布号 DE19901210(A1) 申请公布日期 2000.07.27
申请号 DE19991001210 申请日期 1999.01.14
申请人 SIEMENS AG 发明人 SCHREMS, MARTIN;DRESCHER, DIRK;WURZER, HELMUT;TEWS, HELMUT
分类号 H01L29/78;H01L21/28;H01L21/316;H01L21/8242;H01L27/108;H01L29/51;(IPC1-7):H01L29/78 主分类号 H01L29/78
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