发明名称 |
METHOD OF FORMING FIELD OXIDE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming a field oxide is to remove a bird's beak at side portions of the field oxide, thereby decreasing the degradation of an electrical property due to etching damage. CONSTITUTION: A method of forming a field oxide(70) comprises the steps of: sequentially depositing a pad oxide film(20) and a nitride film(30) on a semiconductor substrate(10), followed by etching a photoresist film to form a contact hole; annealing the substrate for compensating the damage of the substrate exposed from the contact hole and then growing a selective buffer layer on the substrate; depositing a spacer nitride film on the epi selective buffer layer grown in the contact hole; and etching the spacer nitride film to form a spacer and then growing an oxide layer in the contact hole to form the field oxide.
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申请公布号 |
KR20000045896(A) |
申请公布日期 |
2000.07.25 |
申请号 |
KR19980062509 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, GEUM BEOM;GONG, YEONG TAEK |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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