发明名称 METHOD OF FORMING FIELD OXIDE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming a field oxide is to remove a bird's beak at side portions of the field oxide, thereby decreasing the degradation of an electrical property due to etching damage. CONSTITUTION: A method of forming a field oxide(70) comprises the steps of: sequentially depositing a pad oxide film(20) and a nitride film(30) on a semiconductor substrate(10), followed by etching a photoresist film to form a contact hole; annealing the substrate for compensating the damage of the substrate exposed from the contact hole and then growing a selective buffer layer on the substrate; depositing a spacer nitride film on the epi selective buffer layer grown in the contact hole; and etching the spacer nitride film to form a spacer and then growing an oxide layer in the contact hole to form the field oxide.
申请公布号 KR20000045896(A) 申请公布日期 2000.07.25
申请号 KR19980062509 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, GEUM BEOM;GONG, YEONG TAEK
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
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