| 摘要 |
PROBLEM TO BE SOLVED: To calibrate the output timing of test signal in a semiconductor test device, having a socket which has a first terminal capable of giving test signals to a semiconductor device and a driver outputting the test signal to the first terminal. SOLUTION: For this tester provided are a step installing a testing board having a terminal array similar to the terminal array of a semiconductor device 20 to a socket 50, a production step for producing test signals with a driver 76, a detection step for detecting the test signal having reached the testing board and a setting step for setting the output timing of the test signals, based on the test signals detected in the detection step. It is desirable that the contact terminal contacting the first terminal 12 in the testing board have the same input impedance as the contact terminal which makes contact with the first terminal 12 in the semiconductor device 20.
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