发明名称 Method of fabricating interconnect lines and plate electrodes of a storage capacitor in a semiconductor device
摘要 A method of fabricating a semiconductor device where the formation of a conductive layer typically over a storage capacitor on the device is used both as a plate electrode and also as an interconnect line. The method therefore combines the fabrication process steps of forming a plate electrode with the steps of forming a wiring layer. In a preferred embodiment, the storage capacitor is part of a cell array portion of a semiconductor memory device, whereas the interconnect line is in a peripheral portion of the memory device.
申请公布号 US6090662(A) 申请公布日期 2000.07.18
申请号 US19960698257 申请日期 1996.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYEUNG-CHUL
分类号 H01L21/768;H01L21/28;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/768
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