| 摘要 |
PURPOSE: A carrier module of a test tray for testing a semiconductor device is provided to control the drive stroke of fitting levers suppressing the device against external drive stroke for widening the fitting levers. CONSTITUTION: A housing(16) has a cavity(17) for loading the semiconductor device(8), and loading grooves(18) are formed on both sides of the cavity(17) to pass through the housing(16). A pair of links(21) are rotatably about a shaft(22) to be mounted in the grooves(18). Two fitting levers(23) are hinged to the other ends of the links to be lifted/dropped along the cavity(17) in accordance with the rotation of the links(21). Torsion springs(25) are supported between the shaft(22) and a link shaft(24) to widen the distance between the shafts(22,24). Two buttons(27) are mounted to be lifted on the housing(16) having a slide surface(27a) to be slid under the state contacted with the link shaft(24). Fitting units are respectively equipped in the housing and buttons to prevent the release of the buttons from the housing.
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