发明名称 TEST APPARATUS OF ANALOG-TO-DIGITAL CONVERTER
摘要 PURPOSE: A test apparatus of an analog-to-digital converter is provided to be able to test the converter without a separate equipment at the exterior and to move automatically of a test process. CONSTITUTION: A test apparatus of an analog-to-digital converter comprises a pattern generating part(21), a digital-to-analog converting part(23), a multiplexer(25), a comparator(27) and a control part(29). The pattern generating part(21) receives a reset signal(RST) and an operation signal(RDN) from the control part(29) and a clock signal(CLK), and generates one of 2¬n digital test patterns. The digital-to-analog converting part(23) converts the digital test pattern from the pattern generating part(21) into an analog signal. The comparator(27) compares the digital test pattern from the pattern generating part(21) with an output of an analog-to-digital converter(10). The multiplexer(25) receives an analog input signal(Ain) and an output signal of the digital-to-analog converting part(23), and outputs either one of the receives signals in response to a select signal(SEL) from the control part(29). The control part(29) is activated by a start signal(START), and generates an error signal(ERR) in response to an output of the comparator(27).
申请公布号 KR20000042436(A) 申请公布日期 2000.07.15
申请号 KR19980058601 申请日期 1998.12.24
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 BAE, JONG HONG
分类号 H03M1/10;(IPC1-7):H03M1/10 主分类号 H03M1/10
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