发明名称 LIGHT TRANSMITTANCE ON LIGHT HAVING SHORT WAVELENGTH IMPROVED IMAGE SENSOR AND FABRICATION METHOD THEREOF
摘要 PURPOSE: A light transmittance on light having short wavelength improved image sensor and fabrication method thereof is to selectively increase light transmittance with respect to light having a short wavelength or a specific wavelength. CONSTITUTION: A fabrication method of a light transmittance-improved image sensor comprises the steps of: stacking an oxide layer(103) and a nitride layer(104) in the named order as a protecting layer on a semiconductor substrate having a metal line(101) formed thereon; forming a packing layer(109) of oxide on a predetermined portion of the nitride layer; selectively etching a predetermined portion of the nitride layer where the packing layer is not formed and on which a specific color filter layer(106) of a color filter array having red, green and blue is being formed; and forming the color filter array on the resultant substrate including the etched nitride layer.
申请公布号 KR20000041446(A) 申请公布日期 2000.07.15
申请号 KR19980057305 申请日期 1998.12.22
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 BYUN, SEONG CHEOL
分类号 H01L27/14;(IPC1-7):H01L27/14 主分类号 H01L27/14
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