发明名称 |
LIGHT TRANSMITTANCE ON LIGHT HAVING SHORT WAVELENGTH IMPROVED IMAGE SENSOR AND FABRICATION METHOD THEREOF |
摘要 |
PURPOSE: A light transmittance on light having short wavelength improved image sensor and fabrication method thereof is to selectively increase light transmittance with respect to light having a short wavelength or a specific wavelength. CONSTITUTION: A fabrication method of a light transmittance-improved image sensor comprises the steps of: stacking an oxide layer(103) and a nitride layer(104) in the named order as a protecting layer on a semiconductor substrate having a metal line(101) formed thereon; forming a packing layer(109) of oxide on a predetermined portion of the nitride layer; selectively etching a predetermined portion of the nitride layer where the packing layer is not formed and on which a specific color filter layer(106) of a color filter array having red, green and blue is being formed; and forming the color filter array on the resultant substrate including the etched nitride layer.
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申请公布号 |
KR20000041446(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980057305 |
申请日期 |
1998.12.22 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
BYUN, SEONG CHEOL |
分类号 |
H01L27/14;(IPC1-7):H01L27/14 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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