发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A semiconductor device having an electrostatic discharge protection circuit is provided to improve a characteristic of an electrostatic discharge protection. CONSTITUTION: A semiconductor device includes an electrostatic discharge(ESD) protection circuit having a series stack structure that a general metal oxide semiconductor(GMOS) and a low threshold voltage GMOS(LVTGMOS) are connected in series. In particular, a NPN field transistor is provided for the ESD protection circuit so that a Vss terminal of the NPN field transistor is connected between a pad and the series stack structure. While the NPN field transistor provides a separate current path, a distance between the GMOS and the LVTGMOS as well as a distance between a drain region of the GMOS and a well pickup are relatively widened. Accordingly, the NPN field transistor performs the ESD protection and thereby an over current in the drain of the GMOS is prevented.
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申请公布号 |
KR20000043190(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980059540 |
申请日期 |
1998.12.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
HWANG, YUN TAEK;KIM, HYEON GON |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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