发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device having an electrostatic discharge protection circuit is provided to improve a characteristic of an electrostatic discharge protection. CONSTITUTION: A semiconductor device includes an electrostatic discharge(ESD) protection circuit having a series stack structure that a general metal oxide semiconductor(GMOS) and a low threshold voltage GMOS(LVTGMOS) are connected in series. In particular, a NPN field transistor is provided for the ESD protection circuit so that a Vss terminal of the NPN field transistor is connected between a pad and the series stack structure. While the NPN field transistor provides a separate current path, a distance between the GMOS and the LVTGMOS as well as a distance between a drain region of the GMOS and a well pickup are relatively widened. Accordingly, the NPN field transistor performs the ESD protection and thereby an over current in the drain of the GMOS is prevented.
申请公布号 KR20000043190(A) 申请公布日期 2000.07.15
申请号 KR19980059540 申请日期 1998.12.28
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 HWANG, YUN TAEK;KIM, HYEON GON
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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