发明名称 METHOD FOR FORMING BIT LINES OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming bit lines of semiconductor device is provided to form a buffer layer on a portion which titanium silicide is generated, thereby preventing the degradation of the device. CONSTITUTION: A method for forming bit lines of semiconductor device comprises steps of: forming a lower insulating layer having a bit line contact hole formed on a substrate; forming a titanium film; forming a silicon layer on the titanium film; forming a titanium nitride layer; performing RTA(rapid thermal annealing) process to the substrate, thereby forming a titanium silicide film on the boundary of the contact hole and the substrate; and forming a tungsten film filling the contact hole.
申请公布号 KR20000045347(A) 申请公布日期 2000.07.15
申请号 KR19980061905 申请日期 1998.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, SANG HYUB;CHAE, MU SEONG;YEO, IN SEOK;LEE, DONG HYUN;OH, JUN HO
分类号 H01L21/82;(IPC1-7):H01L21/82 主分类号 H01L21/82
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