发明名称 |
METHOD FOR FORMING BIT LINES OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming bit lines of semiconductor device is provided to form a buffer layer on a portion which titanium silicide is generated, thereby preventing the degradation of the device. CONSTITUTION: A method for forming bit lines of semiconductor device comprises steps of: forming a lower insulating layer having a bit line contact hole formed on a substrate; forming a titanium film; forming a silicon layer on the titanium film; forming a titanium nitride layer; performing RTA(rapid thermal annealing) process to the substrate, thereby forming a titanium silicide film on the boundary of the contact hole and the substrate; and forming a tungsten film filling the contact hole.
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申请公布号 |
KR20000045347(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061905 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, SANG HYUB;CHAE, MU SEONG;YEO, IN SEOK;LEE, DONG HYUN;OH, JUN HO |
分类号 |
H01L21/82;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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