发明名称 |
SEMICONDUCTOR DEVICE FOR DETECTING HEAT-IMAGE AND METHOD FOR DETECTING HEAT-IMAGE |
摘要 |
PURPOSE: A semiconductor device for detecting a heat-image and a method for detecting the heat-image are provided to reduce manufacturing cost of articles and to simplify the process by changing the structure of the semiconductor device for detecting the heat-image. CONSTITUTION: A heat-image detecting apparatus has a semiconductor chip(100) having a circuit therein. An insulation film pattern(102a) is formed on the semiconductor chip(100) and a heat-conductive film pattern(104a) connected to a heat emitting plate is formed on the insulation film pattern(102a). A heat-shield film pattern(106a) is formed on the heat-conductive film pattern(104a). A dielectric film pattern(108a) is formed on the heat-shield film pattern(106a) such that an upper portion of an edge portion of the heat-shield film pattern(106a) is exposed. A metal pad(112) is placed along the dielectric film pattern(102a) and the semiconductor chip(100).
|
申请公布号 |
KR20000045049(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061561 |
申请日期 |
1998.12.30 |
申请人 |
KEC CORP. |
发明人 |
YOON, TAE JUN |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|