发明名称 SEMICONDUCTOR DEVICE FOR DETECTING HEAT-IMAGE AND METHOD FOR DETECTING HEAT-IMAGE
摘要 PURPOSE: A semiconductor device for detecting a heat-image and a method for detecting the heat-image are provided to reduce manufacturing cost of articles and to simplify the process by changing the structure of the semiconductor device for detecting the heat-image. CONSTITUTION: A heat-image detecting apparatus has a semiconductor chip(100) having a circuit therein. An insulation film pattern(102a) is formed on the semiconductor chip(100) and a heat-conductive film pattern(104a) connected to a heat emitting plate is formed on the insulation film pattern(102a). A heat-shield film pattern(106a) is formed on the heat-conductive film pattern(104a). A dielectric film pattern(108a) is formed on the heat-shield film pattern(106a) such that an upper portion of an edge portion of the heat-shield film pattern(106a) is exposed. A metal pad(112) is placed along the dielectric film pattern(102a) and the semiconductor chip(100).
申请公布号 KR20000045049(A) 申请公布日期 2000.07.15
申请号 KR19980061561 申请日期 1998.12.30
申请人 KEC CORP. 发明人 YOON, TAE JUN
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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