发明名称 |
FABRICATION METHOD OF IMAGE SENSOR HAVING PINNED PHOTODIODE |
摘要 |
PURPOSE: A fabrication method of an image sensor having a pinned photodiode is to enhance optical sensitivity and depress the potential barrier formed at the channel region of the transfer transistor. CONSTITUTION: A fabrication method of an image sensor comprises the steps of: providing a semiconductor layer(11) having a first conductive type; forming an isolation insulating layer(13) and a gate electrode(15) of a CMOS(Complementarily metal oxide semiconductor) transistor on the semiconductor layer; forming a first ion-implanted layer(16) having a second conductive type opposite to the first conductive type in the semiconductor layer of where a pinned photodiode is being formed; forming a mask pattern(20) in which an upper portion of the first ion-implanted layer and an edge of the insulating isolation layer are exposed; etching exposed portion of the insulating isolation layer using the mask as etch stopper; and forming a second ion-implanted layer(21) having the first conductive type below the exposed surface of the semiconductor layer using the mask as ion implanting barrier.
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申请公布号 |
KR20000041452(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980057311 |
申请日期 |
1998.12.22 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
PARK, SANG HUN |
分类号 |
H01L31/10;H01L27/13;H01L27/14;(IPC1-7):H01L27/13 |
主分类号 |
H01L31/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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