发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided which can improve the process yield and the reliability of device operation by omitting a process to form a storage electrode contact. CONSTITUTION: A method for fabricating a semiconductor device can omit an additional photolithography process to remove an etch stopper on a peripheral circuit region on a semiconductor substrate(12), by the processes of: forming a first inter level insulation film(20) on top of the semiconductor substrate where a storage electrode contact plug(22) and a bit line(24) are formed; forming the etch stopper revealing a part where a storage electrode contact is to be formed on a cell region of the substrate on top of the first inter level insulation film; forming a second inter level insulation film(30) on top of the etch stopper; revealing the storage electrode contact plug by etching the second and first inter level insulation films; and forming a storage electrode connected to the storage electrode contact plug. The method also simplifies the process by forming the storage electrode without a process to form another storage electrode contact connected to the storage electrode contact plug.
申请公布号 KR20000043228(A) 申请公布日期 2000.07.15
申请号 KR19980059578 申请日期 1998.12.28
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, WON CHUL;KIM, JONG PIL
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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