发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided which can improve the process yield and the reliability of device operation by omitting a process to form a storage electrode contact. CONSTITUTION: A method for fabricating a semiconductor device can omit an additional photolithography process to remove an etch stopper on a peripheral circuit region on a semiconductor substrate(12), by the processes of: forming a first inter level insulation film(20) on top of the semiconductor substrate where a storage electrode contact plug(22) and a bit line(24) are formed; forming the etch stopper revealing a part where a storage electrode contact is to be formed on a cell region of the substrate on top of the first inter level insulation film; forming a second inter level insulation film(30) on top of the etch stopper; revealing the storage electrode contact plug by etching the second and first inter level insulation films; and forming a storage electrode connected to the storage electrode contact plug. The method also simplifies the process by forming the storage electrode without a process to form another storage electrode contact connected to the storage electrode contact plug.
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申请公布号 |
KR20000043228(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980059578 |
申请日期 |
1998.12.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, WON CHUL;KIM, JONG PIL |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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