发明名称 SPUTTERING METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To make the thickness of a film on the substrate surface uniform and symmetrical by sputtering a target in a state in which the introduction of gas into a vacuum chamber is cut off, and, the exhaust of a vacuum chamber is cut off. SOLUTION: In a state in which a main valve 4 and a movable valve 3 are opened, a vacuum chamber 1 is exhausted to a degree of 10-7 Torr. A gas introducing valve 8 is opened, and, by using a gas flow rate controller 6, into the vacuum chamber 1, discharge gas 7 is introduced by a prescribed flow rate. As the discharge gas 7, gaseous argon is used. Next, the pressure in the vacuum chamber 1 is controlled to the prescribed one by the movable valve 3. The main valve 4 and the gas introducing valve 8 are simultaneously closed by a control device 15, and, simultaneously, electric power is applied to a sputtering electrode 10 by a power source 11 to form plasma on a target 9 and to form a thin film on a substrate 14. The nonuniformity of the pressure caused by the flow of gas in the vacuum chamber 1 in the process of the formation of the thin film is solved to make the film thickness of the thin film to be formed uniform and symmetrical.
申请公布号 JP2000192236(A) 申请公布日期 2000.07.11
申请号 JP19980371931 申请日期 1998.12.28
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 AOKURA ISAMU;KIMURA TEIICHI;HAYATA HIROSHI;YAMAMOTO MASAHIRO;MORI TATSUYUKI
分类号 C23C14/34;(IPC1-7):C23C14/34 主分类号 C23C14/34
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