发明名称 |
SYSTEM AND METHOD FOR PRINT ANALYSIS |
摘要 |
A system and method is disclosed for analyzing a test pattern printed by a printing device onto a substrate to determine the printing properties of the substrate. The test pattern includes: (i) a first cell having a background o f a first color and a pattern of a second color and (ii) a second cell having a background of the second color and a pattern of the first color. The pattern s each include a plurality of dots that are randomly positioned within each pattern. Prior to analyzing the test pattern, the first and second colors ar e differentiated from each other using color-band and threshold selection techniques. A variety of print defect indices are disclosed for analyzing th e test pattern including a gain index, a raggedness index, a circularity index , and a non-uniformity index. The results of analysis can be calculated as a single value for a simple and convenient representation of the print quality of the substrate.
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申请公布号 |
CA2356677(A1) |
申请公布日期 |
2000.07.06 |
申请号 |
CA19992356677 |
申请日期 |
1999.12.23 |
申请人 |
CHAMPION INTERNATIONAL CORPORATION |
发明人 |
ROSENBERGER, ROY;AMERO, BERNARD A. |
分类号 |
B41J29/46;B41J2/21;G01B11/24;G06K15/02;G06T1/00;G06T11/60;H04N1/46;(IPC1-7):G06K15/02 |
主分类号 |
B41J29/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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