发明名称 |
METHOD OF MANUFACTURING SILICON-ON-INSULATOR WAFER |
摘要 |
PURPOSE: A method of manufacturing a SOI(silicon-on-insulator) wafer is to make uniform the thickness of a silicon layer on which a device is to be formed, and to prevent the deterioration of an electrical property thereof. CONSTITUTION: A method of manufacturing a SOI wafer comprises the steps of: providing a first silicon substrate(10) and a second silicon substrate composed of a bulk silicon, respectively; forming a thermal oxide film(11) on a surface at one side of the first silicon substrate; ion-implanting a boron ion or a phosphorus ion into a prescribed depth from the surface at one side of the second silicon substrate to form an impurity layer; joining the surface at one side of the second silicon substrate onto the thermal oxide film; polishing the surface at the other side of the second silicon substrate by a prescribed depth; etching the surface at the other side of the second silicon substrate to a portion adjoining the impurity layer; etching a portion of the second silicon substrate remaining on the impurity layer; and polishing the surface at the other side of the second silicon substrate comprising the impurity layer by a prescribed depth.
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申请公布号 |
KR20000040424(A) |
申请公布日期 |
2000.07.05 |
申请号 |
KR19980056057 |
申请日期 |
1998.12.18 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, SEONG EUN |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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