发明名称 WAFER LEVEL CHIP SCALE PACKAGE HAVING DUMMY SOLDER BALL
摘要 PURPOSE: A wafer level chip scale package(WL-CSP) is provided to prevent a micro-distortion of the package. CONSTITUTION: A package(200) includes a semiconductor chip(110) having bonding pads(112) formed on an active surface(114). The bonding pads(112) are electrically connected with metal wirings(120) and then redistributed to ball pads(122). The package(200) further includes a dielectric layer(130) covering the active surface(114) and the metal wirings(120), and solder balls(140) formed on the ball pads(122) exposed through the dielectric layer(130). In addition, the package(200) includes dummy pads(124) formed on the active surface(114), not electrically connected with the bonding pads(112), and exposed through the dielectric layer(130). Moreover, dummy solder balls(150) are formed on the dummy pads(124) at similar intervals to the solder balls(140). Therefore, the package(200) has a regular distribution of solder balls(140,150), and thereby the package(200) can be stably jointed on a main board.
申请公布号 KR20000040592(A) 申请公布日期 2000.07.05
申请号 KR19980056261 申请日期 1998.12.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, SEOK CHEOL
分类号 H01L23/28;(IPC1-7):H01L23/28 主分类号 H01L23/28
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