发明名称 Lithographic projection apparatus
摘要 <p>A lithographic projection apparatus comprising: a radiation system LA, Ex, IN, CO for supplying a projection beam PB of electromagnetic radiation; a mask table MT provided with a mask holder for holding a mask MA; a substrate table WT provided with a substrate holder for holding a substrate W; a projection system PL for imaging an irradiated portion of the mask MA onto a target portion C of the substrate W, whereby the electromagnetic radiation has a wavelength less than 200 nm, and the apparatus further comprises means for maintaining the energy dose Ds at substrate level at a substantially constant value, by substantially compensating for irradiation-induced drift in the intensity Is at substrate level. &lt;IMAGE&gt;</p>
申请公布号 EP1014197(A2) 申请公布日期 2000.06.28
申请号 EP19990309872 申请日期 1999.12.08
申请人 ASML NETHERLANDS B.V. 发明人 VAN DER VEEN, PAUL;NOORDMAN, OSCAR FRANCISCUS JOZEPHUS
分类号 G03F7/20;(IPC1-7):G03F7/20 主分类号 G03F7/20
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