发明名称 |
APPARATUS AND METHOD FOR PLASMA ETCHING |
摘要 |
PROBLEM TO BE SOLVED: To efficiently execute a uniform etching process at a low cost. SOLUTION: The plasma etching method for plasma-etching a substrate 7 to be treated on a lower electrode 3 opposed to an upper electrode 6 in a treating chamber 5 is such that, a mixed gas contg. O and F is fed into the treating chamber 5 and the plasma discharge is performed between the upper and lower electrodes, in the condition that the product PL of the discharge pressure P of the mixed gas in the treating chamber 5 and the interelectrode distance L (m) ranges between 2.5 Pa.m and 15 Pa.m which provides a good etching rate. |
申请公布号 |
JP2000173995(A) |
申请公布日期 |
2000.06.23 |
申请号 |
JP19980343909 |
申请日期 |
1998.12.03 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ARITA KIYOSHI;HAJI HIROSHI |
分类号 |
H01L21/302;C23F4/00;H01L21/00;H01L21/3065;H01L21/78;H05H1/46 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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