发明名称 ELECTROOPTICAL PROBE
摘要 <p>PROBLEM TO BE SOLVED: To provide an electrooptical probe where the diameter of a probe has been made thin. SOLUTION: Light being separated by beam splitters 5a and 7a is folded back by 90 degrees with reflection surfaces 5c and 7c and the light axis of a laser beam that is emitted from a laser diode 9 is made parallel with that of light entering photodiodes 12 and 13, thus arranging the photodiodes 12 and 13 flush with the laser diode 9, thus eliminating a space for arranging the photodiode in the diameter direction of a probe body 15.</p>
申请公布号 JP2000171487(A) 申请公布日期 2000.06.23
申请号 JP19990275383 申请日期 1999.09.28
申请人 ANDO ELECTRIC CO LTD;NIPPON TELEGR & TELEPH CORP <NTT> 发明人 ITO AKINARI;OTA KATSUSHI;YAGI TOSHIYUKI;SHINAGAWA MITSURU;NAGATSUMA TADAO;YAMADA JUNZO
分类号 G01R1/06;G01R13/40;G01R15/24;G01R31/302;(IPC1-7):G01R13/40 主分类号 G01R1/06
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