发明名称 |
DISTANCE MEASURING EQUIPMENT |
摘要 |
PROBLEM TO BE SOLVED: To measure a thickness of a film or the like or a distance from a conductive substance in a simple manner by changing a distance between a distribution plane of an element having a distribution inductance interacting with the conductive substance such as a metal and a conductive substance opposite thereto in parallel. SOLUTION: When a distance between a surface of an inductor distributed two-dimensionally and a conductive substance 10 decreases, both are electrically coupled to each other. The distance between them is measured from a drop in inductance of the inductor 20 due to counteraction of electromagnetically induced current. A detection circuit constitutes an LC circuit 35 with a concentrated capacitor 30 connected in series with the inductor 20. An output signal form the LC circuit 35 is input via a transistor amplifier 31 to a feedback network 32 and a frequency counter 33. An output from the feedback network 32 is positively fed back to the inductor 20, and the frequency counter 33 outputs a distance measurement output signal 34.
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申请公布号 |
JP2000171204(A) |
申请公布日期 |
2000.06.23 |
申请号 |
JP19980342405 |
申请日期 |
1998.12.02 |
申请人 |
NIPPON SYSTEM KAIHATSU KK;AKAMATSU NORIO |
发明人 |
KANEOKA HIDEJI;AKAMATSU NORIO |
分类号 |
G01B7/00;G01B7/06;(IPC1-7):G01B7/00 |
主分类号 |
G01B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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