| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC testing device which can perform a high-speed testing by branching out the comparison result of a level comparator placed at a test station to the channel of another test station and inputting the signals outputted from the same IC to be tested to the channels of plural test stations, to logically compare these inputted signals with the expected value with different timings. SOLUTION: Signals which are branched by branching circuits 133A and 133B are selected by selectors 134 and switched between a normal test state and a double-speed test state. Tested IC 119A and 119B are mounted on the test heads of test stations TS1 and TS2 respectively, and stations are tested separately by each station. The selectors 134 select the same input terminal respectively and outputs of their own level comparators 117A1 and 117B1 to the strobe circuits 130. The selectors 134 are placed at each of front stage sides of strobe circuits of each channel to simultaneously test two ICs.
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