发明名称 APPARATUS FOR MEASURING-HIGH FREQUENCY COMPONENTS
摘要 PROBLEM TO BE SOLVED: To sequentially measure characteristics of a high-frequency components to which a DC voltage is supplied by switching a voltage of a DC power source, without switching a high-frequency signal for select the component to be measured. SOLUTION: A plurality of high-frequency components are connected in parallel with one measuring instrument. A measured, high-frequency signal is simultaneously applied to the components. Output of the components are connected to measurement signal input terminals of the instrument, only DC voltage supplied to the components are sequentially switched and supplied, and characteristics of the components to which the DC voltages are supplied are sequentially measured. Since only AGC voltage is switched, without switching the high frequency signals in this apparatus for measuring, only the AGC voltage of the DC voltage may be switched to switch the components 1, 2,..., N to be measured needs to be switched. Accordingly, the signals to be switches are reduce to only one DC signal to obtain a simple constitution. Furthermore, a complicated expensive device for switching the high frequency signals is eliminated to reduce the cost and to improve reliability.
申请公布号 JP2000162259(A) 申请公布日期 2000.06.16
申请号 JP19980333228 申请日期 1998.11.24
申请人 SONY CORP 发明人 MAEDA NAO
分类号 H04N17/04;G01R31/00;(IPC1-7):G01R31/00 主分类号 H04N17/04
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