发明名称 IC transporting apparatus, IC posture altering apparatus and IC take-out apparatus
摘要 A semiconductor device transporting apparatus and a semiconductor device posture altering apparatus are provided which constitute a portion of a semiconductor device transporting and handling apparatus used in a semiconductor device testing apparatus of magazine/tray combination type. The semiconductor device transporting apparatus and the semiconductor device posture altering apparatus are used for loading onto a test tray in the horizontal posture semiconductor devices from a magazine supported in an inclined posture by which semiconductor devices can run out therefrom by their own weights. The posture of the semiconductor device in the inclined state discharged from the magazine is altered to horizontal posture by using either one of a posture altering rail having a slope gradually reduced to horizontal at the end of the rail, a movable rail horizontally rotated after having received the semiconductor device in the inclined posture thereby altering the posture of the semiconductor device to horizontal posture, and a rotary arm rotated by 180 DEG after having received the semiconductor device in the inclined posture thereby altering the posture of the semiconductor device to horizontal posture.
申请公布号 US6074158(A) 申请公布日期 2000.06.13
申请号 US19990382415 申请日期 1999.08.23
申请人 ADVANTEST CORPORATION 发明人 YUTAKA, WATANABE;HIROSHI, OKUDA;KAZUYUKI, YAMASHITA;MAKOTO, SAGAWA;HARUKI, NAKAJIMA;SHIGENORI, KAWANO
分类号 G01R31/01;G01R31/26;G01R31/28;G01R31/319;H01L21/68;H05K13/02;(IPC1-7):B65B21/02 主分类号 G01R31/01
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