发明名称 DIFFRACTION DEFLECTION BEAM SCANNING DEVICE
摘要 PURPOSE: A device is to hold a symmetric feature even though a beam scanned from each source of light is reflected with a reflection mirror, by arranging many sources of light on a straight line which is perpendicular to a direction of scanning beam. CONSTITUTION: A device comprises: many sources of light; a deflection disk(130) established so as to enable to be rotated on the source of light and formed a pattern diffraction-deflecting beam output from the source of light; many first reflection mirrors changing a path of beam diffraction-deflected from the deflection disk; and many second reflection mirrors reflecting beam reflected from the first reflection mirrors into a scanning direction of beam, wherein the sources of light are arranged in a line on a straight line perpendicular to the scanning direction of beam, the second reflection mirrors are arranged in the different heights on the rotation center line of the deflection disk.
申请公布号 KR20000032243(A) 申请公布日期 2000.06.05
申请号 KR19980048646 申请日期 1998.11.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, SEONG MIN;LEE, WON HYEONG;CHOI, HWAN YEONG;LEE, MAN GYU;MIN, JI HONG;KIM, YEONG IL;CHOI, JIN SEUNG;EOM, JAE YONG
分类号 B41J2/44;G02B26/10;G03G15/04;G03G21/00;H04N1/191;(IPC1-7):G03G21/00 主分类号 B41J2/44
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