| 摘要 |
A method and device for performing two dimensional redundancy determinations on embedded memories is provided. The method and device permit the calculation and implementation of two-dimensional redundancy without saving a failure map of the memory being tested. The method and device dynamically determines whether any failed memory cells are present within the array and attempts to repair the cells. Two logic procedures are implemented: a "must fix" word and bit line procedure and a "single cell" repair procedure. The "must fix" word and bit line procedure counts the number of failed first dimensional memory components (i.e., bit lines or word lines) along a second dimensional memory component (i.e., word line or bit line). If the number of failed memory elements is greater than the number of redundant first dimensional components, a redundant second dimensional component is soft-fused in placed of the second dimensional memory component. The "single cell" repair procedure attempts to repair any failed single memory cells by soft-fusing redundant word or bit lines for the failed single memory cell's word or bit line, as appropriate.
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