| 摘要 |
An electrical contact assembly (10) for use, for example, in interfacing between a circuit board or the like to be tested and test apparatus has first and second contact plungers (14, 16) which are slidably mounted in an outer barrel (12) with respective contact projections (14c, 16c) extending out opposite ends of the barrel. The first contact plunger (14) is hollow and slidably receives therein an elongated longitudinally extending portion (16a) of the second contact plunger (16), the contact plungers being biased apart by a coil spring (18) mounted between respective spring seats (14e, 16g) of the contact plungers. Alternate embodiments (10', 10'') include a plurality of longitudinally extending fingers (14h, 16h) formed in one of the plungers which form an interference fit with the other plunger. In another embodiment (10''') the first and second contact plungers (14'', 16'') are interlocked together by means of a decreased diameter portion (14k) in the bore of the first contact plunger and a cooperating enlarged diameter portion (16m) at the distal end of the elongated portion (16a).
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